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1. WO2020137416 - FINE PARTICLE DETECTION ELEMENT AND FINE PARTICLE DETECTOR

Publication Number WO/2020/137416
Publication Date 02.07.2020
International Application No. PCT/JP2019/047596
International Filing Date 05.12.2019
IPC
G01N 15/06 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
06Investigating concentration of particle suspensions
G01N 27/68 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
68using electric discharge to ionise a gas
CPC
G01N 15/06
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
06Investigating concentration of particle suspensions
G01N 27/68
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
62by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
68using electric discharge to ionise a gas
Applicants
  • 日本碍子株式会社 NGK INSULATORS, LTD. [JP]/[JP]
Inventors
  • 奥村 英正 OKUMURA, Hidemasa
  • 織部 晃暢 ORIBE, Akinobu
Agents
  • 特許業務法人アイテック国際特許事務所 ITEC INTERNATIONAL PATENT FIRM
Priority Data
2018-24445527.12.2018JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) FINE PARTICLE DETECTION ELEMENT AND FINE PARTICLE DETECTOR
(FR) ÉLÉMENT DE DÉTECTION DE PARTICULES FINES ET DÉTECTEUR DE PARTICULES FINES
(JA) 微粒子検出素子及び微粒子検出器
Abstract
(EN) A fine particle detection element 20 is used to detect fine particles 26 in a gas. The gas is introduced into a gas flow path 24, and a charge generation unit 30 adds a charge 28 generated through discharging to the fine particles 26 in the gas so as to make the fine particles 26 charged fine particles P. A partition wall 22e having a shape that is not flat partitions the gas flow path 24 into first and second branch flow paths 241, 242. A trapping electrode 54 is provided on the partition wall 22e and traps the charged fine particles P.
(FR) L'invention concerne un élément de détection (20) de particules fines qui est utilisé pour détecter des particules fines (26) dans un gaz. Le gaz est introduit dans un trajet d'écoulement (24) de gaz, et une unité de génération de charge (30) ajoute une charge (28) générée par décharge dans les particules fines (26) du gaz de façon à transformer les particules fines (26) en particules fines chargées (P). Une paroi de séparation (22e), dont la forme n'est pas plate, sépare le trajet d'écoulement (24) de gaz en un premier et un second trajet d'écoulement de ramification (241, 242). Une électrode de piégeage (54) est disposée sur la paroi de séparation (22e) et piège les particules fines chargées (P).
(JA) 微粒子検出素子20は、ガス中の微粒子26を検出するために用いられる。電荷発生部30は、ガス流路24に導入されたガス中の微粒子26に放電によって発生させた電荷28を付加して帯電微粒子Pにする。非平坦形状の仕切り壁22eは、ガス流路24を第1及び第2分岐流路241,242に仕切る。捕集電極54は、仕切り壁22eに設けられ、帯電微粒子Pを捕集する。
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