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1. WO2002025265 - PROBING METHOD USING ION TRAP MASS SPECTROMETER AND PROBING DEVICE

Available information on National Phase entries(more information)
OfficeEntry DateNational NumberNational Status
United States of America13.12.200210311270
European Patent Office19.12.20022000961110Published: 18.06.2003
Withdrawn: 21.06.2016