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1. WO2020137194 - SEMICONDUCTOR WAFER EVALUATION METHOD AND MANUFACTURING METHOD AND SEMICONDUCTOR WAFER MANUFACTURING PROCESS MANAGEMENT METHOD

International Application Status
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26.10.2021International Application Status ReportHTML, PDF, XMLPDF, XML
Published International Application
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02.07.2020Initial Publication with ISR( (A1 27/2020))PDF (23p.)
Search and Examination-Related Documents
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29.06.2021(IB/373) International Preliminary Report on Patentability Chapter IPDF (5p.)
05.05.2021English Translation of the Written Opinion of the International Searching AuthorityPDF (6p.)
02.07.2020Translation of the ISRPDF (2p.)
02.07.2020(ISA/210) International Search ReportPDF (3p.)
02.07.2020(ISA/237) Written Opinion of the International Searching AuthorityPDF (4p.)
Related Documents on file at the International Bureau
DateTitleViewDownload
29.06.2021(IB/373) English Translation of International Preliminary Report on Patentability Chapter IPDF (7p.)
29.06.2021(IB/326) Notification of Transmittal of Copies of International Preliminary Report on Patentability Chapter IPDF (1p.)
20.04.2021(IB/308) Notice Informing the Applicant of the Communication of the International Application to the Designated OfficesPDF (1p.)
21.07.2020(IB/308) Notice Informing the Applicant of the Communication of the International Application to the Designated OfficesPDF (1p.)
02.07.2020(IB/311) Notification Concerning Availability of Publication of the International ApplicationPDF (1p.)
02.07.2020(IB/301) Notification of receipt of record copyPDF (1p.)
02.07.2020Priority DocumentPDF (17p.)
02.07.2020(IB/304) Notification Concerning Submission or Transmittal of Priority DocumentPDF (1p.)
02.07.2020Application Body as FiledPDF (18p.)
02.07.2020(RO/101) Request formPDF (4p.)