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1. WO2020137194 - SEMICONDUCTOR WAFER EVALUATION METHOD AND MANUFACTURING METHOD AND SEMICONDUCTOR WAFER MANUFACTURING PROCESS MANAGEMENT METHOD

Available information on National Phase entries(more information)
OfficeEntry DateNational NumberNational Status
Republic of Korea15.06.20211020217018302Published: 07.07.2021
China25.06.2021201980086184.9Published: 06.08.2021
Germany28.06.2021112019006459Published: 09.09.2021