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1. WO2020137194 - SEMICONDUCTOR WAFER EVALUATION METHOD AND MANUFACTURING METHOD AND SEMICONDUCTOR WAFER MANUFACTURING PROCESS MANAGEMENT METHOD

JP2020106399METHOD FOR EVALUATING SEMICONDUCTOR WAFER, METHOD FOR MANUFACTURING THE SAME, AND METHOD FOR MANAGING STEPS FOR MANUFACTURING THE SAME
Appl.Date 27.12.2018
Appl.No 2018245448 Applicant SUMCO CORP Pub.Kind A Pub.Lang ja
Inclusion Criteria IC5
Sole priority inside the family.
Pub.Date 09.07.2020
WO/2020/137194SEMICONDUCTOR WAFER EVALUATION METHOD AND MANUFACTURING METHOD AND SEMICONDUCTOR WAFER MANUFACTURING PROCESS MANAGEMENT METHOD
Appl.Date 11.11.2019
Appl.No PCT/JP2019/044039 Applicant SUMCO CORPORATION Pub.Kind A Pub.Lang ja
Inclusion Criteria IC1
PCT application from which the family originated.
Pub.Date 02.07.2020
KR1020210084633반도체 웨이퍼의 평가 방법 및 제조 방법 그리고 반도체 웨이퍼의 제조 공정 관리 방법
Appl.Date 11.11.2019
Appl.No 1020217018302 Applicant 가부시키가이샤 사무코 Pub.Kind A
Inclusion Criteria IC2
National entry of a PCT application.

If this application is not visible in the National Phase tab of the PCT application, its relationship to the PCT application is identified from the PCT or regional filing or publication information of its bibliographic data.

Pub.Date 07.07.2021
CN113227770半导体晶片的评价方法和制造方法以及半导体晶片的制造工序管理方法
Appl.Date 11.11.2019
Appl.No 201980086184.9 Applicant 胜高股份有限公司 Pub.Kind A
Inclusion Criteria IC2
National entry of a PCT application.

If this application is not visible in the National Phase tab of the PCT application, its relationship to the PCT application is identified from the PCT or regional filing or publication information of its bibliographic data.

Pub.Date 06.08.2021
DE112019006459Halbleiterwafer-Bewertungsverfahren und Herstellungsverfahren und Halbleiterwafer-Herstellungsprozess-Steuerungsverfahren
Appl.Date 28.06.2021
Appl.No 112019006459 Applicant SUMCO CORPORATION Pub.Kind T5
Inclusion Criteria IC2
National entry of a PCT application.

If this application is not visible in the National Phase tab of the PCT application, its relationship to the PCT application is identified from the PCT or regional filing or publication information of its bibliographic data.

Pub.Date 09.09.2021