(12) International Application Status Report

Received at International Bureau: 25 December 2019 (25.12.2019)

Information valid as of: 26 December 2019 (26.12.2019)

Report generated on: 19 September 2020 (19.09.2020)

(10) Publication number: (43) Publication date: (26) Publication language:
WO 2020/12983825 June 2020 (25.06.2020) Japanese (JA)

(21) Application number: (22) Filing date: (25) Filing language:
PCT/JP2019/04891613 December 2019 (13.12.2019) Japanese (JA)

(31) Priority number(s): (32) Priority date(s): (33) Priority status:
2018-235794 (JP)17 December 2018 (17.12.2018) Priority document received (in compliance with PCT Rule 17.1)

(51) International Patent Classification:
C07K 16/00 (2006.01); C12P 21/08 (2006.01); C12N 5/0781 (2010.01); C12Q 1/02 (2006.01); G01N 33/53 (2006.01)

(71) Applicant(s):
KANEKA CORPORATION [JP/JP]; 3-18, Nakanoshima 2-chome, Kita-ku, Osaka-shi, Osaka 5308288 (JP) (for all designated states)
TOKYO UNIVERSITY OF SCIENCE FOUNDATION [JP/JP]; 1-3, Kagurazaka, Shinjuku-ku, Tokyo 1628601 (JP) (for all designated states)

(72) Inventor(s):
MOUTAI Tatsuya; c/o KANEKA CORPORATION, 1-8, Takasagocho Miyamaecho, Takasago-shi, Hyogo 6768688 (JP)
NAKAISHI Tomoyuki; c/o KANEKA CORPORATION, 1-8, Takasagocho Miyamaecho, Takasago-shi, Hyogo 6768688 (JP)
KITA Hiroshi; c/o KANEKA CORPORATION, 1-8, Takasagocho Miyamaecho, Takasago-shi, Hyogo 6768688 (JP)
YOSHIDA Shinichi; c/o KANEKA CORPORATION, 1-8, Takasagocho Miyamaecho, Takasago-shi, Hyogo 6768688 (JP)
KITANO Mitsuaki; c/o KANEKA CORPORATION, 1-8, Takasagocho Miyamaecho, Takasago-shi, Hyogo 6768688 (JP)
KITAMURA Daisuke; c/o TOKYO UNIVERSITY OF SCIENCE FOUNDATION, 1-3, Kagurazaka, Shinjuku-ku, Tokyo 1628601 (JP)

(74) Agent(s):
SIKS & CO.; 8th Floor, Kyobashi-Nisshoku Bldg., 8-7, Kyobashi 1-chome, Chuo-ku, Tokyo 1040031 (JP)

(54) Title (EN): SCREENING METHOD FOR CELLS PRODUCING SPECIFIC ANTIGEN-SPECIFIC ANTIBODY
(54) Title (FR): PROCÉDÉ DE CRIBLAGE POUR CELLULES PRODUISANT UN ANTICORPS SPÉCIFIQUE D'UN ANTIGÈNE SPÉCIFIQUE
(54) Title (JA): 特定抗原特異的抗体を産生する細胞のスクリーニング方法

(57) Abstract:
(EN): The present invention addresses the problem of providing a method for efficiently screening culture supernatant including cells that produce a specific antigen-specific antibody from a culture supernatant of cells that produce human antibodies. The present invention provides a method for screening culture supernatant including cells that produce a specific antigen-specific antibody from a culture supernatant of cells that produce human antibodies, the method involving using antibody-dependent cytotoxic activity as an indicator, wherein the method comprises selecting culture supernatant that satisfies prescribed conditions defined in the specification as the culture supernatant including cells that produce a specific antigen-specific antibody.
(FR): La présente invention aborde le problème consistant à fournir un procédé de criblage efficace de surnageant de culture comprenant des cellules qui produisent un anticorps spécifique d'un antigène spécifique à partir d'un surnageant de culture de cellules qui produisent des anticorps humains. La présente invention concerne un procédé de criblage de surnageant de culture comprenant des cellules qui produisent un anticorps spécifique d'un antigène spécifique à partir d'un surnageant de culture de cellules qui produisent des anticorps humains, le procédé impliquant l'utilisation d'une activité cytotoxique dépendante d'anticorps en tant qu'indicateur, le procédé comprenant la sélection d'un surnageant de culture qui satisfait à des conditions prescrites définies dans la spécification en tant que surnageant de culture comprenant des cellules qui produisent un anticorps spécifique d'un antigène spécifique.
(JA): 本発明の課題は、ヒト抗体を産生する細胞の培養上清から、特定抗原特異的抗体を産生する細胞を含む培養上清を効率的にスクリーニングする方法を提供することである。本発明によれば、ヒト抗体を産生する細胞の培養上清から、抗体依存性細胞障害活性を指標として、特定抗原特異的抗体を産生する細胞を含む培養上清をスクリーニングする方法であって、明細書に規定する所定の条件を満たす培養上清を、特定抗原特異的抗体を産生する細胞を含む培養上清として選択する方法が提供される。

International search report:
Received at International Bureau: 09 March 2020 (09.03.2020) [JP]

International Report on Patentability (IPRP) Chapter II of the PCT:
Not available

(81) Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
European Patent Office (EPO) : AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR
African Intellectual Property Organization (OAPI) : BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG
African Regional Intellectual Property Organization (ARIPO) : BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW
Eurasian Patent Organization (EAPO) : AM, AZ, BY, KG, KZ, RU, TJ, TM