(12) International Application Status Report

Received at International Bureau: 28 January 2004 (28.01.2004)

Information valid as of: Not available

Report generated on: 31 July 2021 (31.07.2021)

(10) Publication number: (43) Publication date: (26) Publication language:
WO 2004/05728508 July 2004 (08.07.2004) English (EN)

(21) Application number: (22) Filing date: (25) Filing language:
PCT/IB2003/00608919 December 2003 (19.12.2003) English (EN)

(31) Priority number(s): (32) Priority date(s): (33) Priority status:
02080427.4 (EP)19 December 2002 (19.12.2002) Priority document received (in compliance with PCT Rule 17.1)

(51) International Patent Classification:
G01J 3/10 (2006.01); G01J 3/28 (2006.01); G01J 3/36 (2006.01); G01N 21/27 (2006.01); G01N 21/31 (2006.01)

(71) Applicant(s):
KONINKLIJKE PHILIPS ELECTRONICS N.V. [NL/NL]; Groenewoudseweg 1 NL-5621 BA Eindhoven (NL) (for all designated states except US)
SCHUURMANS, Frank, J., P. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
VAN BEEK, Michael, C. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
BAKKER, Levinus, P. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
RENSEN, Wouter, H., J. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
HENDRIKS, Bernardus, H., W. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
HENDRIKS, Robert, F., M. [NL/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)
STEFFEN, Thomas [DE/NL]; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL) (for US only)

(72) Inventor(s):
SCHUURMANS, Frank, J., P.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
VAN BEEK, Michael, C.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
BAKKER, Levinus, P.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
RENSEN, Wouter, H., J.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
HENDRIKS, Bernardus, H., W.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
HENDRIKS, Robert, F., M.; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)
STEFFEN, Thomas; c/o Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)

(74) Agent(s):
SCHOUTEN, Marcus, M.; Philips Intellectual Property & Standards Prof. Holstlaan 6 NL-5656 AA Eindhoven (NL)

(54) Title (EN): OPTICAL ANALYSIS SYSTEM
(54) Title (FR): SYSTEME D'ANALYSE OPTIQUE

(57) Abstract:
(EN): The optical analysis system (20) for determining an amplitude of a principal component of an optical signal comprises a multivariate optical element (10) for reflecting the optical signal and thereby weighing the optical signal by a spectral weighing function, and a detector (9, 9P, 9N) for detecting the weighed optical signal. The optical analysis system (20) may further comprise a dispersive element (2) for spectrally dispersing the optical signal, the multivariate optical element being arranged to receive the dispersed optical signal. The blood analysis system (40) comprises the optical analysis system (20) according to the invention.
(FR): Cette invention concerne un système d'analyse optique (20) permettant de déterminer l'amplitude d'une première composante d'un signal optique, qui comprend un élément optique multivariable (10) reflétant le signal optique et par la même pondérant ledit signal au moyen d'une fonction de pondération spectrale, et un détecteur (9, 9P, 9N) détectant le signal optique pondéré. Le système d'analyse optique (20) peut comporter en outre un élément de dispersion (2) assurant une dispersion spectrale du signal optique, l'élément optique mutlivariables étant conçu de manière à recevoir le signal optique dispersé. Le système d'analyse de sang (40) comprend le système d'analyse optique (20) de l'invention.

International search report:
Received at International Bureau: 21 April 2004 (21.04.2004) [EP]

International Report on Patentability (IPRP) Chapter II of the PCT:
Not available

(81) Designated States:
AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW
European Patent Office (EPO) : AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, NL, PT, RO, SE, SI, SK, TR
African Intellectual Property Organization (OAPI) : BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG
African Regional Intellectual Property Organization (ARIPO) : BW, GH, GM, KE, LS, MW, MZ, SD, SL, SZ, TZ, UG, ZM, ZW
Eurasian Patent Organization (EAPO) : AM, AZ, BY, KG, KZ, MD, RU, TJ, TM

Declarations:
Declaration made as applicant's entitlement, as at the international filing date, to apply for and be granted a patent (Rules 4.17(ii) and 51bis.1(a)(ii)), in a case where the declaration under Rule 4.17(iv) is not appropriate