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1. (WO1989008837) A DEVICE FOR MEASURING THERMAL PROPERTIES OF A SAMPLE OF A SUBSTANCE
Anmerkung: Text basiert auf automatischer optischer Zeichenerkennung (OCR). Verwenden Sie bitte aus rechtlichen Gründen die PDF-Version.

CLAIMS

1. A device for measuring thermal properties of a test substance, which device incorporates a thin strip (6) or a layer (4) of a electrically conductive material, e.g. metal, intended to be brought in heat conductive contact with said test substance (3), means for passing an electric current through said strip or layer for supplying heat to the test substance and causing a temperature increase therein and instrument for recording the voltage variation over the strip or the layer as a function of time and to evaluate therefrom thermal properties, such as thermal conductivity and diffusivity of the test substance, c h a r a c t e r i z e d t h e r e i n,
that the active part of said strip (6) or layer (4) has mainly equal length and width (2d), whereby the geometry of the strip or the layer constitutes part of the calculating model upon which the calculation of the thermal properties of the test substance is based.

2. A device as claimed in claim 1,
c h a r a c t e r i z e d t h e r e i n,
that it incorporates a metal foil (6) with etched away, narrow and mainly parallel strips (8) with maintained unbroken current path passed the strips, that the metal foil is fixed between thin layers of an electric insulating supporting material (7), and that the portion of the metal foil forming current path through the etched portion of the metal foil has mainly the same heigth and width.

3. A device as claimed in claim 1,
c h a r a c t e r i z e d t h e r e i n,
that it incorporates a layer (4) deposited directly upon the test substance (3) or via an intermediate thin layer of an electrically insulating material of said electrically conducting material, e.g. metal.

4. A device as claimed in claim 3,
c h a r a ct e r i z e d t h e r e i n,
that it incorporates a pair of probe pads (2a, b) having a length and a width exceeding the active width (2d) of the layer (4) fitted directly against the test substance (3) at a mutual distance corresponding to the active width (2d) of the layer, which layer (4) has a length exceeding the width (2d) and is arranged between the probe pads (2a, b) with a portion of the projecting length overlapping each probe pad (2a, b).

5. A device as claimed in claim 4,
c h a r a c t e r i z e d t h e r e i n,
that additional metal layers (5a, b) are arranged on the free portions of said probe pads (2a, b) for forming electrical connections.