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1. (WO2019048727) ELECTRICAL TOMOGRAPHY FOR VERTICAL PROFILING
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CLAIMS

1. An apparatus (600) for determining, by electrical tomography, vertical profile of an electrical property of interest of material (s) present in a target volume (618) in a container (630) on the basis of measurements of a measurable electrical quantity dependent on said electrical property of interest, the apparatus comprising

a measurement probe (610) arranged to be po-sitioned at a plurality of different, vertically separate measurement levels (650) in a target volume to carry out the measurements of the measurable electrical quantity at the different measurement levels, the measurement probe comprising

a plurality of measurement elements (111) each having an interface surface (112) arranged to be, with the measurement probe positioned within the target volume, in measurement connection with the material (s) present in the target volume; each interface surface having a size, a shape, and a rotational position; a measurement path (114) for measurement of the measurable electrical quantity being formed, with the measurement probe in use, between two interface surfaces, the measurement path being dependent on the sizes of, the shapes of, and the rotational positions of the two interface surfaces, and the distance between the two interface surfaces along the surface of the measurement probe; the locations, rotational positions, shapes, and sizes of the interface surfaces of the plurality of measurement elements being selected to provide at least two different measurement paths differing from each other in one or more of said sizes of, shapes of, rotational positions of, and distances between the associated interface surfaces.

2. An apparatus (100) as defined in claim 1, the distance between two interface surfaces along the surface of the measurement probe being defined by a connecting line (119), wherein the connecting lines associated to the at least two different measurement paths (114) extend at a non-zero angle relative to each other.

3. An apparatus as defined in claim 1 or 2, the measurement probe (510) having a principal axis (516) and being arranged to be positioned at the different measurement levels with the principal axis oriented sub-stantially vertically.

4. An apparatus as defined in claim 3, wherein the interface surfaces (512a, 512b) of the measurement elements (511a, 511b) are positioned so as to lie at two or more different planes (517a, 517b) lying perpendicularly to the principal axis (516) .

5. An apparatus as defined in claims 3 or 4, wherein the interface surface (512a, 512b) of a measurement element (511a, 511b) has a width in a direction perpendicular to the principal axis (516), and a length in a direction parallel to the principal axis, the length of the interface surface being substantially larger than the width, for example, at least twice the width.

6. An apparatus as defined in any of claims 1 to 5, wherein the measurement probe (300) comprises an electrically insulating layer (313) covering the interface surfaces (312) of the measurement elements (311) .

7. An apparatus (200) as defined in any of claims 1 to 6, comprising an anchoring arrangement (220) for being anchored in a support structure (231) of a container (230) having the target volume in it, the measurement probe being connected to the anchoring arrangement so as to be vertically movably suspended therefrom.

8. An apparatus (100) as defined in any of claims 1 to

7, wherein the electrical property of interest is electrical admittivity, permittivity, or conductivity.

9. An apparatus (600) as defined in any of claims 1 to

8, further comprising a computing system (660) configured to determine a vertical profile of an electrical property of interest of material (s) present in a tar-get volume (618) on the basis of measurements of a measurable electrical quantity dependent on said electrical property of interest, carried out at different measurement levels by the measurement probe (610); the measurements being carried out, at least for one meas-urement level (650), via at least two different measurement paths; wherein determining the profile of the electrical property of interest comprises determining an effect of possible contaminant, accumulated on the interface surface of a measurement element, on the measurements on the basis of the measurements of the measurable electrical quantity via the at least two different measurement paths.

10. An electrical tomography method (700) for deter-mining a vertical profile of an electrical property of interest of material (s) present in a target volume in a container on the basis of measurements of a measurable electrical quantity dependent on said electrical property of interest, carried out at a plurality of different measurement levels by an apparatus as defined in any of claims 1 to 9; the measurements being carried out, at least for one measurement level, via at least two different measurement paths; wherein determining the profile of the electrical property of interest comprises determining an effect of possible contaminant, accumulated on the interface surface of a measurement elements on the measurements, on the basis of the measurements of the measurable electrical quantity via the at least two different measurement paths.

11. A method (700) as defined in claim 10, wherein the electrical property of interest is electrical admit-tivity, permittivity, or conductivity.

12. A method (700) as defined in claim 10 or 11, wherein the target volume comprises oil, and the electrical property of interest is dependent on water content of the oil.

13. A computer program product comprising program code instructions which, when executed by a processor, cause the processor to perform the method according to any of claims 10 to 12.

14. A computer program product as defined in claim 13, stored on a computer-readable medium.