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[Parsed Query:ID:"WO2009046519"
, No hits:1
, QUERY:ID:"WO2009046519" STEMMING:null OFFICES:
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PATENTSCOPE
1. (WO2009046519) SYSTEM AND METHOD FOR THE THREE-DIMENSIONAL MAPPING OF A STRUCTURAL SURFACE
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Pub. No.:
WO/2009/046519
International Application No.:
PCT/CA2008/001769
Publication Date:
16.04.2009
International Filing Date:
08.10.2008
IPC:
G01B 11/24
(2006.01),
E02D 33/00
(2006.01)
G
PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
E
FIXED CONSTRUCTIONS
02
HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL-SHIFTING
D
FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
33
Testing foundations or foundation structures
Applicants:
HYDRO-QUEBEC
[CA/CA]; 75, boulevard René-Levesque Ouest, Montréal, Québec H2Z 1A4 (CA)
(For All Designated States Except US)
.
MIRAILLES, François
[CA/CA]; (CA)
(For US Only)
.
HOUDE, Régis
[CA/CA]; (CA)
(For US Only)
.
BEAUDRY, Julien
[CA/CA]; (CA)
(For US Only)
.
HAZEL, Bruce
[CA/CA]; (CA)
(For US Only)
.
CÔTÉ, Jean
[CA/CA]; (CA)
(For US Only)
.
BLAIN, Michel
[CA/CA]; (CA)
(For US Only)
.
SARRAILLON, Serge
[CA/CA]; (CA)
(For US Only)
Inventors:
MIRAILLES, François
; (CA).
HOUDE, Régis
; (CA).
BEAUDRY, Julien
; (CA).
HAZEL, Bruce
; (CA).
CÔTÉ, Jean
; (CA).
BLAIN, Michel
; (CA).
SARRAILLON, Serge
; (CA)
Agent:
MORIN, Luc
; 210, boul. de Montarville, Suite 2009, Boucherville, Québec J4B 6T3 (CA)
Priority Data:
2,606,267
11.10.2007
CA
Title
(EN)
SYSTEM AND METHOD FOR THE THREE-DIMENSIONAL MAPPING OF A STRUCTURAL SURFACE
(FR)
SYSTÈME ET MÉTHODE DE CARTOGRAPHIE TRIDIMENSIONNELLE D'UNE SURFACE STRUCTURELLE
Abstract:
(EN)
The invention relates to a system and a method for the three-dimensional mapping of a structural surface. Two wires extend at the front of and along the structural surface in order to define a reference surface area. A measuring unit including a laser assembly and a camera is moved in front of the structural surface in order to progressively scan the surface. Two separate light planes directed towards the structural surface are projected using the laser assembly. Images of the structural surface containing lines resulting from an intersection of the light planes with the structural surface and four reference points resulting from an intersection of the light planes with the wires are detected using the camera. The images are processed in order to determine the 3D co-ordinates of the lines defining the mapping in a reference system related to the reference surface area while considering the position and the orientation of the measuring unit based on the reference points.
(FR)
Système et méthode de cartographie tridimensionnelle d'une surface structurelle. Deux fils sont tendus devant et le long de la surface structurelle de manière à définir une surface de référence. Une unité de mesure comportant un ensemble laser et une caméra est déplacée devant la surface structurelle de manière à balayer progressivement la surface. Deux plans de lumière distincts dirigés vers la surface structurelle sont projetés au moyen de l'ensemble laser. Des images de la surface structurelle contenant des lignes résultant d'une intersection des plans de lumière avec la surface structurelle et quatre points de référence résultant d'une intersection des plans de lumière avec les fils sont captées au moyen de la caméra. Les images sont traitées pour déterminer les coordonnées 3D des lignes définissant la cartographie dans un repère lié à la surface de référence considérant la position et l'orientation de l'unité de mesure d'après les points de référence.
Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language:
French (FR)
Filing Language:
French (FR)